通常(chang)情況下,金(jin)相試(shi)樣(yang)(yang)的制(zhi)(zhi)備包括(kuo)了取樣(yang)(yang)、鑲(xiang)嵌、標號、磨光、顯示等幾個(ge)(ge)步(bu)(bu)驟(zou)(zou)。但不是(shi)每(mei)個(ge)(ge)金(jin)相試(shi)樣(yang)(yang)的制(zhi)(zhi)備都必須經歷上述步(bu)(bu)驟(zou)(zou)。如(ru)果所選取的試(shi)樣(yang)(yang)形狀、大小(xiao)合(he)適(shi),便于握持磨制(zhi)(zhi),則不必進行(xing)(xing)鑲(xiang)嵌;如(ru)果檢驗僅是(shi)材料(liao)中(zhong)非(fei)金(jin)屬(shu)夾雜物或(huo)鑄(zhu)鐵中(zhong)的石墨,則不必進行(xing)(xing)浸(jin)蝕(shi)。總之,應根據具(ju)體目的來確定制(zhi)(zhi)樣(yang)(yang)步(bu)(bu)驟(zou)(zou)。
1. 取樣(yang)
取樣(yang)是(shi)金相試(shi)樣(yang)制備(bei)的(de)(de)第一道工(gong)序,若(ruo)取樣(yang)不(bu)當,則達不(bu)到檢驗目的(de)(de),因此,所取試(shi)樣(yang)的(de)(de)部(bu)位、數量、磨面方向等應(ying)嚴格(ge)按照相應(ying)的(de)(de)標準規定(ding)執行。
取(qu)(qu)(qu)樣(yang)(yang)(yang)(yang)中(zhong)還(huan)要(yao)注意三個方(fang)(fang)面的(de)(de)(de)(de)(de)選擇。其(qi)一,取(qu)(qu)(qu)樣(yang)(yang)(yang)(yang)部位和(he)磨面方(fang)(fang)向(xiang)的(de)(de)(de)(de)(de)選擇。取(qu)(qu)(qu)樣(yang)(yang)(yang)(yang)部位須要(yao)和(he)檢(jian)驗目的(de)(de)(de)(de)(de)要(yao)求(qiu)一樣(yang)(yang)(yang)(yang),這(zhe)樣(yang)(yang)(yang)(yang)才能使(shi)切取(qu)(qu)(qu)的(de)(de)(de)(de)(de)試(shi)樣(yang)(yang)(yang)(yang)具有(you)代表性。必要(yao)時,應(ying)在檢(jian)驗報(bao)告單中(zhong)添加(jia)圖文標明取(qu)(qu)(qu)樣(yang)(yang)(yang)(yang)部位、數量和(he)磨面方(fang)(fang)向(xiang)。其(qi)二(er),取(qu)(qu)(qu)樣(yang)(yang)(yang)(yang)方(fang)(fang)法,由于備件材(cai)料的(de)(de)(de)(de)(de)形狀各異,也有(you)用不規(gui)則(ze)外形的(de)(de)(de)(de)(de)試(shi)樣(yang)(yang)(yang)(yang)。若表面不規(gui)則(ze),應(ying)將棱邊倒圓,防(fang)止在磨制時,試(shi)樣(yang)(yang)(yang)(yang)劃破砂紙(zhi)和(he)拋(pao)光織物(wu),造成被(bei)織物(wu)掛飛,造成事故。反之,檢(jian)驗表面的(de)(de)(de)(de)(de)試(shi)樣(yang)(yang)(yang)(yang),嚴(yan)禁(jin)倒角(jiao)并保證(zheng)磨面平整(zheng)。切取(qu)(qu)(qu)試(shi)樣(yang)(yang)(yang)(yang)時根據被(bei)檢(jian)驗材(cai)料的(de)(de)(de)(de)(de)軟硬程度(du)可(ke)采取(qu)(qu)(qu)鋸、車、刨、銑、線(xian)切割等(deng)不同方(fang)(fang)法。其(qi)三,試(shi)樣(yang)(yang)(yang)(yang)的(de)(de)(de)(de)(de)熱(re)處理(li),經取(qu)(qu)(qu)樣(yang)(yang)(yang)(yang)而獲(huo)得的(de)(de)(de)(de)(de)金相(xiang)試(shi)樣(yang)(yang)(yang)(yang),有(you)的(de)(de)(de)(de)(de)可(ke)直接進行(xing)磨制,有(you)的(de)(de)(de)(de)(de)則(ze)需(xu)要(yao)熱(re)處理(li)后才能進行(xing)磨制,如檢(jian)驗鋼(gang)的(de)(de)(de)(de)(de)本質晶粒度(du),非金屬(shu)夾(jia)雜物(wu),碳(tan)化(hua)物(wu)不均勻度(du)等(deng)項目的(de)(de)(de)(de)(de)試(shi)樣(yang)(yang)(yang)(yang),需(xu)經熱(re)處理(li),其(qi)處理(li)方(fang)(fang)法按(an)相(xiang)應(ying)標準規(gui)定執行(xing)。
2. 鑲嵌
當金(jin)相檢(jian)驗(yan)的(de)材料尺寸過小或(huo)形(xing)狀不規(gui)則時,由于不便于握持(chi),可(ke)(ke)采用(yong)(yong)鑲嵌(qian)(qian)(qian)的(de)方法,得到尺寸適當,外(wai)形(xing)規(gui)則的(de)試樣(yang)。當檢(jian)驗(yan)試樣(yang)的(de)表層組(zu)織時,為防止在磨(mo)制中產生倒角(jiao),也(ye)可(ke)(ke)采用(yong)(yong)鑲嵌(qian)(qian)(qian)。一般取樣(yang)后用(yong)(yong)銼刀(dao)或(huo)砂輪將磨(mo)面(mian)修平,便可(ke)(ke)進(jin)行鑲嵌(qian)(qian)(qian)。常(chang)用(yong)(yong)的(de)鑲嵌(qian)(qian)(qian)方法有機械夾(jia)持(chi)法,塑料鑲嵌(qian)(qian)(qian)法和低熔點合金(jin)鑲嵌(qian)(qian)(qian)法等。
3. 磨光
金相試(shi)(shi)樣(yang)經(jing)過取(qu)樣(yang)、鑲(xiang)嵌后(hou),還需進行磨光(guang)(guang)、拋光(guang)(guang)等(deng)工(gong)序,才能獲(huo)得(de)表面(mian)(mian)平整光(guang)(guang)滑(hua)的磨面(mian)(mian)。試(shi)(shi)樣(yang)切取(qu)后(hou)形成的粗糙表面(mian)(mian),經(jing)過粗磨、細(xi)磨、拋光(guang)(guang)工(gong)序后(hou),磨痕(hen)逐漸(jian)消除(chu),從而得(de)到平整光(guang)(guang)滑(hua)的磨面(mian)(mian)。
4. 拋光(guang)
拋(pao)(pao)光(guang)后的試樣表面呈(cheng)現出(chu)平滑光(guang)亮、無(wu)痕鏡面狀態,置(zhi)于金相顯(xian)(xian)(xian)(xian)(xian)微鏡下觀(guan)察時,除了(le)可(ke)以(yi)見到非(fei)金屬(shu)夾雜物(wu)、孔洞(dong)、裂紋、石墨和(he)鉛(qian)(qian)青銅的鉛(qian)(qian)質點以(yi)及(ji)極硬相在拋(pao)(pao)光(guang)時的浮凸(tu)外,只(zhi)能(neng)看(kan)到一(yi)片光(guang)亮,看(kan)不到顯(xian)(xian)(xian)(xian)(xian)微組(zu)織(zhi)。只(zhi)有采用(yong)適(shi)當(dang)的顯(xian)(xian)(xian)(xian)(xian)示(shi)(shi)方法,才能(neng)顯(xian)(xian)(xian)(xian)(xian)示(shi)(shi)出(chu)組(zu)織(zhi)。 顯(xian)(xian)(xian)(xian)(xian)示(shi)(shi)組(zu)織(zhi)的方法很(hen)多(duo),可(ke)分為化學顯(xian)(xian)(xian)(xian)(xian)示(shi)(shi)、電(dian)解顯(xian)(xian)(xian)(xian)(xian)示(shi)(shi)和(he)其它顯(xian)(xian)(xian)(xian)(xian)示(shi)(shi)方法。其中(zhong)化學顯(xian)(xian)(xian)(xian)(xian)示(shi)(shi)法具有顯(xian)(xian)(xian)(xian)(xian)示(shi)(shi)全(quan)面,操作簡便,迅速(su)、經濟(ji)、重現性好等優點。在生產(chan)和(he)科研中(zhong)得到了(le)廣泛(fan)應用(yong)。
最后,上述金相試樣的制備,均需切取試樣,但某些大型機件、構件以及曲面、不銹鋼(gang)管道內壁、斷口、放射性材料等,不允許破壞取樣檢驗,則可采用膠膜復型法,復制成薄膜樣品,可在金相顯微鏡或生物顯微鏡下觀察。
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